Using Memory to Cope with Simultaneous Transient Faults

Eduardo Luis Rhod, Carlos Arthur Lang LisbĂ´a, Luigi Carro. Using Memory to Cope with Simultaneous Transient Faults. In 7th Latin American Test Workshop, LATW 2006, Buenos Aires, Argentina, March 26-29, 2006. pages 151-156, IEEE, 2006.

Abstract

Abstract is missing.