New insights into the change of voltage acceleration and temperature activation of oxide breakdown

G. Ribes, S. Bruyère, F. Monsieur, D. Roy, V. Huard. New insights into the change of voltage acceleration and temperature activation of oxide breakdown. Microelectronics Reliability, 43(8):1211-1214, 2003. [doi]

Authors

G. Ribes

This author has not been identified. Look up 'G. Ribes' in Google

S. Bruyère

This author has not been identified. Look up 'S. Bruyère' in Google

F. Monsieur

This author has not been identified. Look up 'F. Monsieur' in Google

D. Roy

This author has not been identified. Look up 'D. Roy' in Google

V. Huard

This author has not been identified. Look up 'V. Huard' in Google