Automated test procedure to detect permanent faults inside SRAM-based FPGAs - researchr publication authors

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Florian Rittner, Marko Ristic, Robért Glein, Albert Heuberger. Automated test procedure to detect permanent faults inside SRAM-based FPGAs. In 2017 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2017, Pasadena, CA, USA, July 24-27, 2017. pages 16-23, IEEE, 2017. [doi]

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