Florian Rittner, Marko Ristic, Robért Glein, Albert Heuberger. Automated test procedure to detect permanent faults inside SRAM-based FPGAs. In 2017 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2017, Pasadena, CA, USA, July 24-27, 2017. pages 16-23, IEEE, 2017. [doi]
@inproceedings{RittnerRGH17,
title = {Automated test procedure to detect permanent faults inside SRAM-based FPGAs},
author = {Florian Rittner and Marko Ristic and Robért Glein and Albert Heuberger},
year = {2017},
doi = {10.1109/AHS.2017.8046354},
url = {https://doi.org/10.1109/AHS.2017.8046354},
researchr = {https://researchr.org/publication/RittnerRGH17},
cites = {0},
citedby = {0},
pages = {16-23},
booktitle = {2017 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2017, Pasadena, CA, USA, July 24-27, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3439-4},
}