Automated test procedure to detect permanent faults inside SRAM-based FPGAs

Florian Rittner, Marko Ristic, Robért Glein, Albert Heuberger. Automated test procedure to detect permanent faults inside SRAM-based FPGAs. In 2017 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2017, Pasadena, CA, USA, July 24-27, 2017. pages 16-23, IEEE, 2017. [doi]

Abstract

Abstract is missing.