Optical sensor process variability in a 0.18 μm high voltage CMOS technology - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Frederic Roger, Anderson Pires Singulani, Jong Mun Park. Optical sensor process variability in a 0.18 μm high voltage CMOS technology. In 27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017, Thessaloniki, Greece, September 25-27, 2017. pages 1-6, IEEE, 2017. [doi]

This author has not been identified. Look up 'Frederic Roger' in GoogleThis author has not been identified. Look up 'Anderson Pires Singulani' in GoogleThis author has not been identified. Look up 'Jong Mun Park' in Google

runs on WebDSL