Frederic Roger, Anderson Pires Singulani, Jong Mun Park. Optical sensor process variability in a 0.18 μm high voltage CMOS technology. In 27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017, Thessaloniki, Greece, September 25-27, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{RogerSP17,
title = {Optical sensor process variability in a 0.18 μm high voltage CMOS technology},
author = {Frederic Roger and Anderson Pires Singulani and Jong Mun Park},
year = {2017},
doi = {10.1109/PATMOS.2017.8106960},
url = {https://doi.org/10.1109/PATMOS.2017.8106960},
researchr = {https://researchr.org/publication/RogerSP17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017, Thessaloniki, Greece, September 25-27, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6462-5},
}