Jacob N. Rohan, Pingping Zhuang, S. S. Teja Nibhanupudi, Sanjay K. Banerjee, Jaydeep P. Kulkarni. Neural Network Assisted Compact Model for Accurate Characterization of Cycle-to-cycle Variations in 2-D $h$-BN based RRAM devices. In Device Research Conference, DRC 2019, Ann Arbor, MI, USA, June 23-26, 2019. pages 103-104, IEEE, 2019. [doi]
Abstract is missing.