A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting

Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro. A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing, 22(4-6):325-335, 2006. [doi]

Authors

Luís Rolíndez

This author has not been identified. Look up 'Luís Rolíndez' in Google

Salvador Mir

This author has not been identified. Look up 'Salvador Mir' in Google

Ahcène Bounceur

This author has not been identified. Look up 'Ahcène Bounceur' in Google

Jean-Louis Carbonéro

This author has not been identified. Look up 'Jean-Louis Carbonéro' in Google