Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro. A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing, 22(4-6):325-335, 2006. [doi]
@article{RolindezMBC06,
title = {A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting},
author = {Luís Rolíndez and Salvador Mir and Ahcène Bounceur and Jean-Louis Carbonéro},
year = {2006},
doi = {10.1007/s10836-006-9500-z},
url = {http://dx.doi.org/10.1007/s10836-006-9500-z},
tags = {testing},
researchr = {https://researchr.org/publication/RolindezMBC06},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {22},
number = {4-6},
pages = {325-335},
}