Multivariable control of a metrological Atomic Force Microscope - researchr publication authors

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Michael J. C. Ronde, Roel J. E. Merry, Marinus Jacobus Gerardus van de Molengraft, Richard K. Koops, Maarten Steinbuch. Multivariable control of a metrological Atomic Force Microscope. In European Control Conference, ECC 2009, Budapest, Hungary, 23-26 August 2009. pages 2265-2270, IEEE, 2009. [doi]

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