Multivariable control of a metrological Atomic Force Microscope

Michael J. C. Ronde, Roel J. E. Merry, Marinus Jacobus Gerardus van de Molengraft, Richard K. Koops, Maarten Steinbuch. Multivariable control of a metrological Atomic Force Microscope. In European Control Conference, ECC 2009, Budapest, Hungary, 23-26 August 2009. pages 2265-2270, IEEE, 2009. [doi]

@inproceedings{RondeMMKS09,
  title = {Multivariable control of a metrological Atomic Force Microscope},
  author = {Michael J. C. Ronde and Roel J. E. Merry and Marinus Jacobus Gerardus van de Molengraft and Richard K. Koops and Maarten Steinbuch},
  year = {2009},
  url = {http://ieeexplore.ieee.org/document/7074742/},
  researchr = {https://researchr.org/publication/RondeMMKS09},
  cites = {0},
  citedby = {0},
  pages = {2265-2270},
  booktitle = {European Control Conference, ECC 2009, Budapest, Hungary, 23-26 August 2009},
  publisher = {IEEE},
}