M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess. Parameter Monitoring: Advantages and Pitfalls. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 115-124, IEEE Computer Society, 1993.
Abstract is missing.