Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences

Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage. Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 381-384, IEEE, 2014. [doi]

Abstract

Abstract is missing.