Mario Rotigni, Mauro Merlo, Martina Cordoni, Paolo Colombo, Valentino Liberali. Role of IC substrate and ESD protections in noise propagation: Design and modelling of dedicated test chip in 40 nm technology. In 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015. pages 97-102, IEEE, 2015. [doi]
Abstract is missing.