An approach to the analysis and test of crosstalk faults in digital VLSI circuits - researchr publication authors

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Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita. An approach to the analysis and test of crosstalk faults in digital VLSI circuits. In Tony Ambler, Jochen A. G. Jess, Hugo De Man, editors, Proceedings of the conference on European design automation, EURO-DAC'91, Amsterdam, The Netherlands, 1991. pages 72-79, EEE Computer Society, 1991. [doi]

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