An approach to the analysis and test of crosstalk faults in digital VLSI circuits

Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita. An approach to the analysis and test of crosstalk faults in digital VLSI circuits. In Tony Ambler, Jochen A. G. Jess, Hugo De Man, editors, Proceedings of the conference on European design automation, EURO-DAC'91, Amsterdam, The Netherlands, 1991. pages 72-79, EEE Computer Society, 1991. [doi]

@inproceedings{RubioIXK91,
  title = {An approach to the analysis and test of crosstalk faults in digital VLSI circuits},
  author = {Antonio Rubio and Noriyoshi Itazaki and Xiaole Xu and Kozo Kinoshita},
  year = {1991},
  url = {http://dl.acm.org/citation.cfm?id=951530},
  researchr = {https://researchr.org/publication/RubioIXK91},
  cites = {0},
  citedby = {0},
  pages = {72-79},
  booktitle = {Proceedings of the conference on European design automation, EURO-DAC'91, Amsterdam, The Netherlands, 1991},
  editor = {Tony Ambler and Jochen A. G. Jess and Hugo De Man},
  publisher = {EEE Computer Society},
  isbn = {0-8186-2130-3},
}