Test Pattern Generator for Delay Faults - researchr publication authors

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Tomasz Rudnicki, Andrzej Hlawiczka. Test Pattern Generator for Delay Faults. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 255-258, IEEE Computer Society, 2007.

This author has not been identified. Look up 'Tomasz Rudnicki' in GoogleThis author has not been identified. Look up 'Andrzej Hlawiczka' in Google

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