Frequency domain analysis of robust demodulators for high-speed atomic force microscopy - researchr publication authors

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Michael G. Ruppert, David M. Harcombe, Michael R. P. Ragazzon, S. O. Reza Moheimani, Andrew J. Fleming. Frequency domain analysis of robust demodulators for high-speed atomic force microscopy. In 2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017. pages 1562-1567, IEEE, 2017. [doi]

This author has not been identified. Look up 'Michael G. Ruppert' in GoogleThis author has not been identified. Look up 'David M. Harcombe' in GoogleThis author has not been identified. Look up 'Michael R. P. Ragazzon' in GoogleThis author has not been identified. Look up 'S. O. Reza Moheimani' in GoogleThis author has not been identified. Look up 'Andrew J. Fleming' in Google

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