Michael G. Ruppert, David M. Harcombe, Michael R. P. Ragazzon, S. O. Reza Moheimani, Andrew J. Fleming. Frequency domain analysis of robust demodulators for high-speed atomic force microscopy. In 2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017. pages 1562-1567, IEEE, 2017. [doi]
@inproceedings{RuppertHRMF17,
title = {Frequency domain analysis of robust demodulators for high-speed atomic force microscopy},
author = {Michael G. Ruppert and David M. Harcombe and Michael R. P. Ragazzon and S. O. Reza Moheimani and Andrew J. Fleming},
year = {2017},
doi = {10.23919/ACC.2017.7963175},
url = {https://doi.org/10.23919/ACC.2017.7963175},
researchr = {https://researchr.org/publication/RuppertHRMF17},
cites = {0},
citedby = {0},
pages = {1562-1567},
booktitle = {2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5992-8},
}