Michael G. Ruppert, David M. Harcombe, Michael R. P. Ragazzon, S. O. Reza Moheimani, Andrew J. Fleming. Frequency domain analysis of robust demodulators for high-speed atomic force microscopy. In 2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017. pages 1562-1567, IEEE, 2017. [doi]
Abstract is missing.