Characterization and modeling of reliability issues in nanoscale devices

G. Rzepa, Wolfgang Gös, Ben Kaczer, Tibor Grasser. Characterization and modeling of reliability issues in nanoscale devices. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2445-2448, IEEE, 2015. [doi]

Authors

G. Rzepa

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Wolfgang Gös

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Ben Kaczer

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Tibor Grasser

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