Characterization and modeling of reliability issues in nanoscale devices - researchr publication related

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G. Rzepa, Wolfgang Gös, Ben Kaczer, Tibor Grasser. Characterization and modeling of reliability issues in nanoscale devices. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2445-2448, IEEE, 2015. [doi]

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