On the optimized generation of Software-Based Self-Test programs for VLIW processors

Davide Sabena, Matteo Sonza Reorda, Luca Sterpone. On the optimized generation of Software-Based Self-Test programs for VLIW processors. In Srinivas Katkoori, Matthew R. Guthaus, Ayse Kivilcim Coskun, Andreas Burg, Ricardo Reis, editors, 20th IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2012, Santa Cruz, CA, USA, October 7-10, 2012. pages 129-134, IEEE, 2012. [doi]

Abstract

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