A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing

M. Amin Sabet, Behnam Ghavami, Mohsen Raji. A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing. IEEE Transactions on Reliability, 66(1):245-256, 2017. [doi]

Authors

M. Amin Sabet

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Behnam Ghavami

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Mohsen Raji

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