A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing

M. Amin Sabet, Behnam Ghavami, Mohsen Raji. A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing. IEEE Transactions on Reliability, 66(1):245-256, 2017. [doi]

Abstract

Abstract is missing.