M. Amin Sabet, Behnam Ghavami, Mohsen Raji. A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing. IEEE Transactions on Reliability, 66(1):245-256, 2017. [doi]
@article{SabetGR17,
title = {A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing},
author = {M. Amin Sabet and Behnam Ghavami and Mohsen Raji},
year = {2017},
doi = {10.1109/TR.2016.2645479},
url = {http://dx.doi.org/10.1109/TR.2016.2645479},
researchr = {https://researchr.org/publication/SabetGR17},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {66},
number = {1},
pages = {245-256},
}