External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires

Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan. Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 21-24, IEEE, 2018. [doi]

Authors

Sheriff Sadiqbatcha

This author has not been identified. Look up 'Sheriff Sadiqbatcha' in Google

Chase Cook

This author has not been identified. Look up 'Chase Cook' in Google

Zeyu Sun

This author has not been identified. Look up 'Zeyu Sun' in Google

Sheldon X.-D. Tan

This author has not been identified. Look up 'Sheldon X.-D. Tan' in Google
runs on