Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan. Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 21-24, IEEE, 2018. [doi]
Abstract is missing.