Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan. Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 21-24, IEEE, 2018. [doi]
@inproceedings{SadiqbatchaCST18,
title = {Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires},
author = {Sheriff Sadiqbatcha and Chase Cook and Zeyu Sun and Sheldon X.-D. Tan},
year = {2018},
doi = {10.1109/SMACD.2018.8434891},
url = {https://doi.org/10.1109/SMACD.2018.8434891},
researchr = {https://researchr.org/publication/SadiqbatchaCST18},
cites = {0},
citedby = {0},
pages = {21-24},
booktitle = {15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5153-7},
}