R. A. Said. Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. I. Principle and demonstration. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 681-684, IEEE, 2000. [doi]
Abstract is missing.