R. A. Said. Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique. In International Symposium on Circuits and Systems (ISCAS 1999), May 30 - June 2, 1999, Orlando, Florida, USA. pages 124-128, IEEE, 1999. [doi]
@inproceedings{Said99, title = {Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique}, author = {R. A. Said}, year = {1999}, doi = {10.1109/ISCAS.1999.777820}, url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.1999.777820}, tags = {testing}, researchr = {https://researchr.org/publication/Said99}, cites = {0}, citedby = {0}, pages = {124-128}, booktitle = {International Symposium on Circuits and Systems (ISCAS 1999), May 30 - June 2, 1999, Orlando, Florida, USA}, publisher = {IEEE}, isbn = {0-7803-5471-0}, }