Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique - researchr publication related

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R. A. Said. Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique. In International Symposium on Circuits and Systems (ISCAS 1999), May 30 - June 2, 1999, Orlando, Florida, USA. pages 124-128, IEEE, 1999. [doi]

The following publications are possibly variants of this publication:

Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. II. Applications, capabilities, and limitationsR. A. Said. iscas 2000: 657-660 [doi]

Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. I. Principle and demonstrationR. A. Said. iscas 2000: 681-684 [doi]

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