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Modeling the Interdependences Between Voltage Fluctuation and BTI Aging

Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel. Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. VLSI Syst., 27(7):1652-1665, 2019. [doi]

Authors

Sami Salamin

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Victor M. van Santen

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Hussam Amrouch

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Narendra Parihar

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Souvik Mahapatra

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Jörg Henkel

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