Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel. Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. VLSI Syst., 27(7):1652-1665, 2019. [doi]
@article{SalaminSAPMH19,
title = {Modeling the Interdependences Between Voltage Fluctuation and BTI Aging},
author = {Sami Salamin and Victor M. van Santen and Hussam Amrouch and Narendra Parihar and Souvik Mahapatra and Jörg Henkel},
year = {2019},
doi = {10.1109/TVLSI.2019.2899890},
url = {https://doi.org/10.1109/TVLSI.2019.2899890},
researchr = {https://researchr.org/publication/SalaminSAPMH19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {7},
pages = {1652-1665},
}