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Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel. Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. VLSI Syst., 27(7):1652-1665, 2019. [doi]
Abstract is missing.