A High Resolution And Wide Range Temperature Detector Using 180-nm CMOS Process - researchr publication authors

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Ralph Gerard B. Sangalang, Shih-Heng Luo, Chua-Chin Wang. A High Resolution And Wide Range Temperature Detector Using 180-nm CMOS Process. In International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023. pages 64-67, IEEE, 2023. [doi]

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