Ralph Gerard B. Sangalang, Shih-Heng Luo, Chua-Chin Wang. A High Resolution And Wide Range Temperature Detector Using 180-nm CMOS Process. In International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023. pages 64-67, IEEE, 2023. [doi]
@inproceedings{SangalangLW23,
title = {A High Resolution And Wide Range Temperature Detector Using 180-nm CMOS Process},
author = {Ralph Gerard B. Sangalang and Shih-Heng Luo and Chua-Chin Wang},
year = {2023},
doi = {10.1109/ICICDT59917.2023.10332257},
url = {https://doi.org/10.1109/ICICDT59917.2023.10332257},
researchr = {https://researchr.org/publication/SangalangLW23},
cites = {0},
citedby = {0},
pages = {64-67},
booktitle = {International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1931-6},
}