Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu. Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. IEEE Trans. VLSI Syst., 20(3):424-436, 2012. [doi]
@article{SanyalGK12,
title = {Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays},
author = {Alodeep Sanyal and Kunal P. Ganeshpure and Sandip Kundu},
year = {2012},
doi = {10.1109/TVLSI.2011.2106169},
url = {http://dx.doi.org/10.1109/TVLSI.2011.2106169},
researchr = {https://researchr.org/publication/SanyalGK12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {3},
pages = {424-436},
}