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Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu. Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. IEEE Trans. VLSI Syst., 20(3):424-436, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On ATPG for multiple aggressor crosstalk faults in presence of gate delaysKunal P. Ganeshpure, Sandip Kundu. itc 2007: 1-7 [doi] An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate DelaysKunal P. Ganeshpure, Sandip Kundu. vlsid 2009: 233-238 [doi] Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faultsKunal P. Ganeshpure, Sandip Kundu. date 2007: 540-545 [doi] A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate DelaysKunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu. TC, 61(7):986-998, 2012. [doi]
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