Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays

Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu. Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. IEEE Trans. VLSI Syst., 20(3):424-436, 2012. [doi]

Abstract

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