Robustness improvement of an SRAM cell against laser-induced fault injection - researchr publication authors

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Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria. Robustness improvement of an SRAM cell against laser-induced fault injection. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 149-154, IEEE, 2013. [doi]

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