Sébastien Sarrazin, Samuel Evain, Lirida Alves de Barros Naviner, Yannick Bonhomme, Valentin Gherman. Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1077-1082, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
@inproceedings{SarrazinENBG13,
title = {Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection},
author = {Sébastien Sarrazin and Samuel Evain and Lirida Alves de Barros Naviner and Yannick Bonhomme and Valentin Gherman},
year = {2013},
url = {http://dl.acm.org/citation.cfm?id=2485550},
researchr = {https://researchr.org/publication/SarrazinENBG13},
cites = {0},
citedby = {0},
pages = {1077-1082},
booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
editor = {Enrico Macii},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
isbn = {978-1-4503-2153-2},
}