A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits - researchr publication

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Jayashree Saxena, Dhiraj K. Pradhan. A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 724-733, IEEE Computer Society, 1993.

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