An efficient volume-removal algorithm for practical three-dimensional lithography simulation with experimental verification

Edward W. Scheckler, Nelson N. Tam, Anton K. Pfau, Andrew R. Neureuther. An efficient volume-removal algorithm for practical three-dimensional lithography simulation with experimental verification. IEEE Trans. on CAD of Integrated Circuits and Systems, 12(9):1345-1356, 1993. [doi]

Abstract

Abstract is missing.