Holistic coupled field and circuit simulation

Wim Schoenmaker, Peter Meuris, Christian Strohm, Caren Tischendorf. Holistic coupled field and circuit simulation. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 307-312, IEEE, 2016. [doi]

Abstract

Abstract is missing.