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Reliability evaluation of circuits designed in multi- and single-stage versions

R. B. Schvittz, M. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, L. S. da Rosa, Paulo F. Butzen. Reliability evaluation of circuits designed in multi- and single-stage versions. In 9th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2018, Puerto Vallarta, Mexico, February 25-28, 2018. pages 1-4, IEEE, 2018. [doi]

Authors

R. B. Schvittz

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M. Pontes

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Cristina Meinhardt

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Denis Teixeira Franco

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Lirida A. B. Naviner

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L. S. da Rosa

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Paulo F. Butzen

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