R. B. Schvittz, M. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, L. S. da Rosa, Paulo F. Butzen. Reliability evaluation of circuits designed in multi- and single-stage versions. In 9th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2018, Puerto Vallarta, Mexico, February 25-28, 2018. pages 1-4, IEEE, 2018. [doi]
@inproceedings{SchvittzPMFNRB18,
title = {Reliability evaluation of circuits designed in multi- and single-stage versions},
author = {R. B. Schvittz and M. Pontes and Cristina Meinhardt and Denis Teixeira Franco and Lirida A. B. Naviner and L. S. da Rosa and Paulo F. Butzen},
year = {2018},
doi = {10.1109/LASCAS.2018.8399927},
url = {https://doi.org/10.1109/LASCAS.2018.8399927},
researchr = {https://researchr.org/publication/SchvittzPMFNRB18},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {9th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2018, Puerto Vallarta, Mexico, February 25-28, 2018},
publisher = {IEEE},
isbn = {978-1-5386-2311-4},
}