A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP) - researchr publication authors

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Richard M. Sedmak, John Evans. A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP). In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 319-327, IEEE Computer Society, 1995.

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