Richard M. Sedmak, John Evans. A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP). In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 319-327, IEEE Computer Society, 1995.
@inproceedings{SedmakE95,
title = {A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP)},
author = {Richard M. Sedmak and John Evans},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/SedmakE95},
cites = {0},
citedby = {0},
pages = {319-327},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}